Title :
Characterization of White and Flicker Frequency Modulation Noise in Narrow-Linewidth Laser Diodes
Author :
Tsuchida, Hidemi
Author_Institution :
Photonics Res. Inst., Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
fDate :
6/1/2011 12:00:00 AM
Abstract :
Frequency modulation noise of narrow-linewidth external cavity laser diodes is characterized in terms of power spectral density (PSD) using the recirculating delayed self-heterodyne method. The measured PSD is consistent with the oscillator noise model consisting of white and flicker noise. Based on this model, beat signal spectra observed in heterodyne measurements are derived, which explain well the delay- or observation time-dependent lineshape obtained in the experiments.
Keywords :
flicker noise; laser cavity resonators; laser noise; oscillators; semiconductor lasers; spectral line breadth; white noise; beat signal spectra; external cavity laser diode; flicker frequency modulation noise; narrow linewidth laser diodes; oscillator noise model; power spectral density; self-heterodyne method; time dependent lineshape; white noise; Delay; Frequency measurement; Frequency modulation; Laser noise; Measurement by laser beam; Noise measurement; Frequency-modulation (FM) noise; heterodyning; laser diodes; laser noise; noise measurement; spectral analysis;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2011.2132127
