Characterization of White and Flicker Frequency Modulation Noise in Narrow-Linewidth Laser Diodes

Author

Tsuchida, Hidemi

Author_Institution

Photonics Res. Inst., Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan

Volume

23

Issue

11

fYear

2011

fDate

6/1/2011 12:00:00 AM

Firstpage

727

Lastpage

729

Abstract

Frequency modulation noise of narrow-linewidth external cavity laser diodes is characterized in terms of power spectral density (PSD) using the recirculating delayed self-heterodyne method. The measured PSD is consistent with the oscillator noise model consisting of white and flicker noise. Based on this model, beat signal spectra observed in heterodyne measurements are derived, which explain well the delay- or observation time-dependent lineshape obtained in the experiments.

Keywords

flicker noise; laser cavity resonators; laser noise; oscillators; semiconductor lasers; spectral line breadth; white noise; beat signal spectra; external cavity laser diode; flicker frequency modulation noise; narrow linewidth laser diodes; oscillator noise model; power spectral density; self-heterodyne method; time dependent lineshape; white noise; Delay; Frequency measurement; Frequency modulation; Laser noise; Measurement by laser beam; Noise measurement; Frequency-modulation (FM) noise; heterodyning; laser diodes; laser noise; noise measurement; spectral analysis;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/LPT.2011.2132127

Filename

5738666