• DocumentCode
    1480324
  • Title

    Application of the Partial Element Equivalent Circuit Method to Analysis of Transient Potential Rises in Grounding Systems

  • Author

    Yutthagowith, Peerawut ; Ametani, Akihiro ; Nagaoka, Naoto ; Baba, Yoshihiro

  • Author_Institution
    Dept. of Electr. Eng., Doshisha Univ., Kyoto, Japan
  • Volume
    53
  • Issue
    3
  • fYear
    2011
  • Firstpage
    726
  • Lastpage
    736
  • Abstract
    This paper presents calculations of lightning transient potential rises in grounding systems. A partial element equivalent circuit (PEEC) method, adopting a modified image method, is employed in this paper. The modified image method in this paper has two options either including or neglecting images of conduction currents along conductors for calculating series impedances. The effect of retardation in the PEEC method is also investigated. Comparisons of simulation results by the proposed method with those by the method of moments, the finite-difference time-domain method, and experimental results collected from the literature show that the PEEC method with the modified image method is quite effective in the evaluation of transient potential rise in a grounding system.
  • Keywords
    conductors (electric); earthing; equivalent circuits; finite difference time-domain analysis; lightning protection; method of moments; PEEC method; conduction currents; conductors; finite-difference time-domain method; grounding systems; lightning transient potential rises; method of moments; modified image method; partial element equivalent circuit method; retardation effect; series impedances; Conductors; Current measurement; Electric potential; Electrodes; Grounding; Transient analysis; Voltage measurement; Grounding systems; modified image method; partial element equivalent circuit (PEEC) method; transient potential rise;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2010.2077676
  • Filename
    5738675