DocumentCode :
148042
Title :
Characterization of GaN HEMTs for integrated supply modulator
Author :
Pereira, Antonio ; Parker, Anthony ; Heimlich, Michael ; Weste, Neil ; Dunleavy, Larry
Author_Institution :
Dept. of Eng., Macquarie Univ., Sydney, NSW, Australia
fYear :
2014
fDate :
19-23 Jan. 2014
Firstpage :
64
Lastpage :
66
Abstract :
GaN HEMTs are widely used in switching power amplifiers topologies to achieve high power density at very high frequencies due to the enhanced power handling capabilities provided by the SiC substrate and very high transition frequencies of GaN High Electron Mobility Transistors (HEMTs). This paper explores the use of RF GaN HEMTs as power switches in integrated supply modulator topologies. Devices were characterized for power switching and a simple figure of merit was calculated to understand the device performance in terms of its ON resistance and input capacitance.
Keywords :
III-V semiconductors; field effect transistor switches; gallium compounds; high electron mobility transistors; modulators; power HEMT; wide band gap semiconductors; GaN; HEMT; ON resistance; SiC; enhanced power handling capability; figure of merit; high electron mobility transistor; input capacitance; integrated supply modulator topology; power switch; switching power amplifier topology; Capacitance; Gallium nitride; HEMTs; Logic gates; MODFETs; Modulation; Switches; GaN power converters; GaN power switch; integrated supply modulators; power amplifiers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Amplifiers for Wireless and Radio Applications (PAWR), 2014 IEEE Topical Conference on
Conference_Location :
Newport Beach, CA
Print_ISBN :
978-1-4799-2298-7
Type :
conf
DOI :
10.1109/PAWR.2014.6825736
Filename :
6825736
Link To Document :
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