A technique for determining the normalized impedance of slots in the image plane of the image NRDG

Author

Chirwa, Lawrence C. ; Yamamoto, Manabu ; Omiya, Manabu ; Itoh, Kiyohiko

Author_Institution

Graduate Sch. of Eng., Hokkaido Univ. Sapporo, Japan

Volume

49

Issue

5

fYear

2001

fDate

5/1/2001 12:00:00 AM

Firstpage

995

Lastpage

997

Abstract

This paper presents a method for determining the normalized impedance of a transverse slot in the image plane of the image nonradiative dielectric guide using measurements of the standing wave. The method overcomes the problem of distortion caused by the scattered evanescent fields that are present in the vicinity of the slot. The measurement equipment, its optimum parameters, and aspects necessary for accurate measurements are also discussed. Moreover, the finite-difference time-domain technique is employed to determine the normalized slot impedance, and good agreement is obtained with measured results, confirming the reliability of the method

Keywords

electric impedance measurement; finite difference time-domain analysis; microwave measurement; nonradiative dielectric waveguides; waveguide theory; 13 to 14.4 GHz; FDTD technique; finite-difference time-domain technique; image NRD guide; image plane; measurement equipment; nonradiative dielectric guide; normalized impedance; optimum parameters; scattered evanescent fields; slot impedance; standing wave measurements; transverse slot; Dielectric measurements; Distortion measurement; Finite difference methods; Impedance measurement; Insertion loss; Millimeter wave measurements; Millimeter wave technology; Particle measurements; Probes; Time domain analysis;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.920161

Filename

920161