Title :
Three-probe microstrip measuring system for S-parameter measurements
Author :
Li, M.Y. ; Chang, Kuo-Pin
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
fDate :
5/9/1991 12:00:00 AM
Abstract :
The three-probe scheme for input impedance measurement was modified for measuring the S-parameters of a two-port device. The method is simple, low cost and can be easily scaled to millimetre-wave frequencies. The measured results were verified by an automatic network analyser.
Keywords :
S-parameters; microwave measurement; probes; strip line components; S-parameter measurements; low cost; microstrip measuring system; millimetre-wave frequencies; three-probe scheme; two-port device;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19910524
