Title :
PDN Impedance Modeling and Analysis of 3D TSV IC by Using Proposed P/G TSV Array Model Based on Separated P/G TSV and Chip-PDN Models
Author :
Pak, Jun So ; Kim, Joohee ; Cho, Jonghyun ; Kim, Kiyeong ; Song, Taigon ; Ahn, Seungyoung ; Lee, Junho ; Lee, Hyungdong ; Park, Kunwoo ; Kim, Joungho
Author_Institution :
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea
Abstract :
The impedance of a power-distribution network (PDN) in three-dimensionally stacked chips with multiple through-silicon-via (TSV) connections (a 3D TSV IC) was modeled and analyzed using a power/ground (P/G) TSV array model based on separated P/G TSV and chip-PDN models at frequencies up to 20 GHz. The proposed modeling and analysis methods for the P/G TSV and chip-PDN are fundamental for estimating the PDN impedances of 3D TSV ICs because they are composed of several chip-PDNs and several thousands of P/G TSV connections. Using the proposed P/G TSV array model, we obtained very efficient analyses and estimations of 3D TSV IC PDNs, including the effects of TSV inductance and multiple-TSV inductance, depending on P/G TSV arrangement and the number of stacked chip-PDNs of a 3D TSV IC PDN. Inductances related to TSVs, combined with chip-PDN inductance and capacitance, created high upper peaks of PDN impedance, near 1 GHz. Additionally, the P/G TSV array produced various TSV array inductance effects on stacked chip-PDN impedance, according to their arrangement, and induced high PDN impedance, over 10 GHz.
Keywords :
distribution networks; elemental semiconductors; silicon; three-dimensional integrated circuits; 3D TSV IC; P-G TSV array model; chip-PDN impedance modeling; frequency 1 GHz; multiple through-silicon-via connection; power-distribution network; power-ground TSV array model; three-dimensionally stacked chip; Impedance; Inductance; Integrated circuit modeling; Metals; Three dimensional displays; Through-silicon vias; 3D TSV integrated circuit (IC); PDN impedance; Power distribution network (PDN); TSV array inductance; TSV inductance; stacked chip-PDN; three-dimensional (3D); through-silicon-via (TSV);
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCPMT.2010.2101771