DocumentCode
1481041
Title
A self-testing reconfigurable CAM
Author
McAuley, Anthony J. ; Cotton, Charles J.
Author_Institution
Bellcore, Morristown, NJ, USA
Volume
26
Issue
3
fYear
1991
fDate
3/1/1991 12:00:00 AM
Firstpage
257
Lastpage
261
Abstract
The authors describe a 2- mu m CMOS reconfigurable content addressable memory (RCAM), organized as 256 words by 64 b, that can be written, searched, or read with 100-ns cycle time. Designed for general high-speed table lookup applications, the RCAM has self-test and reconfiguration features to simplify testing and improve yield. In test mode the RCAM tests the whole memory array in under 300 clock cycles and automatically reconfigures itself to correct any hard errors it finds, greatly enhancing the chip yield. As an example, the authors describe the application of the RCAM to address translation. Compared to RAM-based address translation, using the RCAM increases speed and reduces complexity. Also, the RCAM´s storage reclamation feature simplifies system storage management by allowing old entries that have not been accessed recently to be freed for reuse.<>
Keywords
CMOS integrated circuits; content-addressable storage; integrated memory circuits; 100 ns; 16384 bit; 2 micron; CMOS; RCAM; address translation; clock cycles; cycle time; hard errors; reclamation feature; self-testing reconfigurable CAM; system storage management; table lookup applications; yield; Automatic testing; Built-in self-test; CADCAM; Clocks; Computer aided manufacturing; Cotton; Packet switching; Random access memory; Read-write memory; Switches;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/4.75003
Filename
75003
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