DocumentCode
1481048
Title
Enclosure-Induced Interference Effects in a Miniaturized Sidescan Sonar
Author
Jonsson, Johan ; Lekholm, V. ; Kratz, H. ; Almqvist, M. ; Thornell, Greger
Author_Institution
Angstrom Space Technol. Centre, Uppsala Univ., Uppsala, Sweden
Volume
37
Issue
2
fYear
2012
fDate
4/1/2012 12:00:00 AM
Firstpage
236
Lastpage
243
Abstract
On, for instance, the miniaturized submersible explorer, Deeper Access, Deeper Understanding (DADU), only 20 cm in length and 5 cm in diameter, the sidescan sonar needs to be tightly mounted in the hull. Finite element analysis (FEA) as well as physical measurements were used to investigate the effects of beam interaction with acoustically nearby rigid boundaries. Computer simulations showed the first major dip in the beam shape to vary in strength, size, and position with the enclosure wall height, from a position of 47 at 0.0-mm wall height to 32 at 3.0-mm wall height. Hydrophonic measurements on the manufactured test device confirmed these values to within 9%, varying between 47 and 29 . In addition, Schlieren imaging was proposed and used as a noninvasive means of qualitative beam shape characterization. A field test was performed with the enclosure height set to 0 and 3 mm. With the latter height, a dark band, corresponding to a sonar sensitivity dip at about 30 in the beam, appeared in the sonar image. It was found that the beam shape is sensitive to small mounting errors, in this case where the wavelength of the sonar is on the same size scale as the enclosure. Furthermore, it was found that FEA models can be used to accurately predict enclosure effects on sonar beam shapes, and Schlieren imaging can be used to visually detect the shape deformations in mounted sonar devices.
Keywords
finite element analysis; sonar imaging; Schlieren imaging; beam interaction; computer simulations; deeper access, deeper understanding; enclosure-induced interference effects; finite element analysis; miniaturized sidescan sonar; miniaturized submersible explorer; Acoustic beams; Imaging; Shape; Sonar equipment; Sonar measurements; Transducers; Beam shape; Schlieren; finite element analysis (FEA); miniaturize; sidescan sonar;
fLanguage
English
Journal_Title
Oceanic Engineering, IEEE Journal of
Publisher
ieee
ISSN
0364-9059
Type
jour
DOI
10.1109/JOE.2012.2188160
Filename
6176264
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