• DocumentCode
    1481048
  • Title

    Enclosure-Induced Interference Effects in a Miniaturized Sidescan Sonar

  • Author

    Jonsson, Johan ; Lekholm, V. ; Kratz, H. ; Almqvist, M. ; Thornell, Greger

  • Author_Institution
    Angstrom Space Technol. Centre, Uppsala Univ., Uppsala, Sweden
  • Volume
    37
  • Issue
    2
  • fYear
    2012
  • fDate
    4/1/2012 12:00:00 AM
  • Firstpage
    236
  • Lastpage
    243
  • Abstract
    On, for instance, the miniaturized submersible explorer, Deeper Access, Deeper Understanding (DADU), only 20 cm in length and 5 cm in diameter, the sidescan sonar needs to be tightly mounted in the hull. Finite element analysis (FEA) as well as physical measurements were used to investigate the effects of beam interaction with acoustically nearby rigid boundaries. Computer simulations showed the first major dip in the beam shape to vary in strength, size, and position with the enclosure wall height, from a position of 47 at 0.0-mm wall height to 32 at 3.0-mm wall height. Hydrophonic measurements on the manufactured test device confirmed these values to within 9%, varying between 47 and 29 . In addition, Schlieren imaging was proposed and used as a noninvasive means of qualitative beam shape characterization. A field test was performed with the enclosure height set to 0 and 3 mm. With the latter height, a dark band, corresponding to a sonar sensitivity dip at about 30 in the beam, appeared in the sonar image. It was found that the beam shape is sensitive to small mounting errors, in this case where the wavelength of the sonar is on the same size scale as the enclosure. Furthermore, it was found that FEA models can be used to accurately predict enclosure effects on sonar beam shapes, and Schlieren imaging can be used to visually detect the shape deformations in mounted sonar devices.
  • Keywords
    finite element analysis; sonar imaging; Schlieren imaging; beam interaction; computer simulations; deeper access, deeper understanding; enclosure-induced interference effects; finite element analysis; miniaturized sidescan sonar; miniaturized submersible explorer; Acoustic beams; Imaging; Shape; Sonar equipment; Sonar measurements; Transducers; Beam shape; Schlieren; finite element analysis (FEA); miniaturize; sidescan sonar;
  • fLanguage
    English
  • Journal_Title
    Oceanic Engineering, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0364-9059
  • Type

    jour

  • DOI
    10.1109/JOE.2012.2188160
  • Filename
    6176264