• DocumentCode
    1481370
  • Title

    Inverse scattering using the finite-element method and a nonlinear optimization technique

  • Author

    Rekanos, Ioannis T. ; Yioultsis, Traianos V. ; Tsiboukis, Theodoros D.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Aristotelian Univ. of Thessaloniki, Greece
  • Volume
    47
  • Issue
    3
  • fYear
    1999
  • fDate
    3/1/1999 12:00:00 AM
  • Firstpage
    336
  • Lastpage
    344
  • Abstract
    A new spatial-domain technique for the reconstruction of the complex permittivity profile of unknown scatterers is proposed in this paper. The technique is based on a combination of the finite-element method (FEM) and the Polak-Ribiere nonlinear conjugate gradient optimization algorithm. The direct scattering problem is explicitly dealt with by means of the differential formulation and it is solved by applying the FEM. The inversion methodology is oriented to minimizing a cost function, which consists of a standard error term and regularization term. A sensitivity analysis, which is carried out by an elaborate finite-element procedure, results in the determination of the direction required for correcting the profile. Significant reduction of the computation time is obtained by introducing the adjoint state vector methodology. The efficiency of the presented inversion technique is validated by applying it to the inversion of synthetic scattered far-field measurements, which are corrupted by additive noise
  • Keywords
    conjugate gradient methods; electromagnetic wave scattering; finite element analysis; image reconstruction; inverse problems; microwave imaging; optimisation; permittivity; sensitivity analysis; FEM; Polak-Ribiere optimization algorithm; additive noise; adjoint state vector methodology; complex permittivity profile reconstruction; conjugate gradient optimization algorithm; cost function minimisation; finite-element method; inverse scattering; nonlinear optimization technique; sensitivity analysis; spatial-domain technique; synthetic scattered far-field measurements; Diffraction; Electromagnetic scattering; Finite element methods; Image reconstruction; Inverse problems; Iterative algorithms; Microwave imaging; Microwave theory and techniques; Optimization methods; Permittivity;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.750236
  • Filename
    750236