• DocumentCode
    1481419
  • Title

    Quadrature-Error Compensation and Corresponding Effects on the Performance of Fully Decoupled MEMS Gyroscopes

  • Author

    Tatar, Erdinc ; Alper, Said Emre ; Akin, Tayfun

  • Author_Institution
    Micro-Electro-Mech. Syst. Res. & Applic. Center, Middle East Tech. Univ., Ankara, Turkey
  • Volume
    21
  • Issue
    3
  • fYear
    2012
  • fDate
    6/1/2012 12:00:00 AM
  • Firstpage
    656
  • Lastpage
    667
  • Abstract
    This paper presents experimental data about the sources of the quadrature error in a fully decoupled microelectromechanical systems gyroscope and demonstrates the extent of performance improvement by the cancellation of this error. Quadrature sources including mass, electrostatic-force, and mechanical-spring imbalances have been compared by FEM simulations, and spring imbalance has been found as the dominant source of the quadrature error. Gyroscopes have been designed with intentional spring imbalances and fabricated with a SOI-based silicon-on-glass fabrication process, the resulting quadrature outputs of the fabricated gyroscopes have been measured, and their agreement with FEM simulations has been verified. Next, it has been experimentally shown that the electrostatic nulling of the quadrature error with closed-loop control electronics improves the bias instability and angle random walk (ARW) of a fully decoupled gyroscope up to ten times. Moreover, the quadrature cancellation improves the scale-factor turn-on repeatability about four times and linearity about 20 times, reaching down to 119 and 86 ppm, respectively. Finally, the quadrature cancellation allows operating the gyroscope with higher drive-mode displacement amplitudes for an increased rate sensitivity. With this technique, outstanding bias instability and ARW performances of 0.39°/h and 0.014 °/√h, respectively, have been achieved.
  • Keywords
    closed loop systems; electrostatics; elemental semiconductors; error compensation; finite element analysis; gyroscopes; microsensors; silicon; silicon compounds; silicon-on-insulator; ARW; FEM simulation; SOI-based silicon-on-glass fabrication process; Si-SiO2; angle random walk; bias instability; closed-loop control electronic; drive-mode displacement amplitude; electrostatic nulling; electrostatic-force imbalance; error cancellation; fully decoupled MEMS gyroscope; fully decoupled microelectromechanical system gyroscope; mass imbalance; mechanical-spring imbalance; quadrature cancellation; quadrature-error compensation; scale-factor turn-on repeatability; Couplings; Drives; Electrodes; Force; Gyroscopes; Micromechanical devices; Springs; Microelectromechanical systems (MEMS) gyro; quadrature-error cancellation; silicon-on-glass (SOG) process; sources of quadrature error;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2012.2189356
  • Filename
    6177208