DocumentCode :
1482281
Title :
Nanostructured semiconductor surfaces induced by an electric field
Author :
Kumar, Pranaw
Author_Institution :
Chem. & Phys. of Mater. Unit, Jawaharlal Nehru Centre for Adv. Sci. Res., Bangalore, India
Volume :
5
Issue :
2
fYear :
2010
fDate :
4/1/2010 12:00:00 AM
Firstpage :
110
Lastpage :
116
Abstract :
Surfaces of single crystal [311] silicon, germanium and GaAs were nanostructured by a DC electric field (0.1-1.5-kV/cm). Spark threshold was found to be 1.33, 0.66 and 0.33-kV/cm for GaAs, silicon and germanium, respectively. Field nanostructuring results in the formation of nanoparticles of grain size in the range of 30-200-nm showed the nanoparticle size increasing with the increase in field value. Electric field treatment of the silicon surface gives rise to a lack of long-range crystalline order for surfaces. The effect of such a nanostructuring process is to make more absorbing and surface-oxidised nanocrystalline photoluminescent surfaces. Electric field treatment gives rise to local and directional nanostructuring.
Keywords :
III-V semiconductors; electric field effects; elemental semiconductors; gallium arsenide; grain size; light reflection; nanofabrication; nanoparticles; oxidation; photoluminescence; semiconductor growth; silicon; GaAs; Si; directional nanostructuring; grain size; nanoparticle; nanostructured semiconductor; single crystal silicon; spark threshold; surface-oxidised nanocrystalline photoluminescent surfaces;
fLanguage :
English
Journal_Title :
Micro & Nano Letters, IET
Publisher :
iet
ISSN :
1750-0443
Type :
jour
DOI :
10.1049/mnl.2010.0007
Filename :
5457360
Link To Document :
بازگشت