Abstract :
During the development of a stable free-running oscillator an unusual frequency drift phenomena was observed. When investigated, the drift was found to be due to the molecular migration of water to and from the oscillator. Although the drift observed is emphasized by the frequency of oscillation and the temperature ranges involved, it is believed that the findings of this work are applicable to the stability of any circuit or component used in an a.c. application. To overcome the water migration effect, the oscillator was dried and sealed, and from this work it is postulated that free-running oscillators with extremely good long-term stabilities are possible.
