DocumentCode :
1482840
Title :
Targeting Design, Verification, and Test Challenges
Volume :
28
Issue :
2
fYear :
2011
Firstpage :
4
Lastpage :
5
Abstract :
This general-interest issue of D&Tfeatures articles on recent advances in design methods such as customization to achieve higher efficiency in terms of power and performance, accurate power estimation for multiprocessor system-on-chips (MPSoCs) based on network-on-chips (NoCs), and low-power and reliable on-chip interconnects. This issue also includes articles on testbench acceleration, testing for small-delay defects to reduce test escapes, and synthesis of scan trees to minimize test time.
Keywords :
MPSoC; NoC; OLSC; design and test; domain-specific computing; scan trees; small-delay defects; testbench acceleration;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2011.39
Filename :
5739838
Link To Document :
بازگشت