• DocumentCode
    1482840
  • Title

    Targeting Design, Verification, and Test Challenges

  • Volume
    28
  • Issue
    2
  • fYear
    2011
  • Firstpage
    4
  • Lastpage
    5
  • Abstract
    This general-interest issue of D&Tfeatures articles on recent advances in design methods such as customization to achieve higher efficiency in terms of power and performance, accurate power estimation for multiprocessor system-on-chips (MPSoCs) based on network-on-chips (NoCs), and low-power and reliable on-chip interconnects. This issue also includes articles on testbench acceleration, testing for small-delay defects to reduce test escapes, and synthesis of scan trees to minimize test time.
  • Keywords
    MPSoC; NoC; OLSC; design and test; domain-specific computing; scan trees; small-delay defects; testbench acceleration;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2011.39
  • Filename
    5739838