DocumentCode :
1482952
Title :
Teaching network connectivity using simulated annealing on a massively parallel processor
Author :
Wilson, Stephen S.
Author_Institution :
Applied Intelligent Syst. Inc., Ann Arbor, MI, USA
Volume :
79
Issue :
4
fYear :
1991
fDate :
4/1/1991 12:00:00 AM
Firstpage :
559
Lastpage :
566
Abstract :
A simulated annealing technique for automatically training a machine vision system to recognize and locate complex objects is described. In this method, the training is used to find an optimum connectivity pattern of a fixed number of inputs that have fixed weights, rather than the usual technique of finding the optimum weights for a fixed connectivity. The recognition model uses a two-layer artificial neural network, where the first layer consists of image edge vectors in four directions. Each neuron in the second layer has a fixed number of connections that connect only to those first layer edges that are best for distinguishing the object from a confusing background. Simulated annealing is used to find the best parameters for defining edges in the first layer, as well as the pattern of connections from the first to the second layer. Weights of the connections are either plus or minus one, so that multiplications are avoided, and the system speed is considerably enhanced. In industrial applications on a low-cost parallel SIMD (single instruction multiple data) architecture, objects can be trained by an unskilled user in less than 1 min, and after training, parts can be located in about 100 ms. This method has been found to work very well on integrated circuit patterns
Keywords :
artificial intelligence; computer vision; computerised pattern recognition; neural nets; parallel processing; simulated annealing; artificial neural network; complex objects; integrated circuit patterns; low-cost parallel SIMD; machine vision system; massively parallel processor; network connectivity teaching; recognition model; simulated annealing; Artificial neural networks; Computer architecture; Computer networks; Education; Image recognition; Industrial training; Learning systems; Machine vision; Pattern recognition; Simulated annealing;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/5.92048
Filename :
92048
Link To Document :
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