Title :
Interconnections-addressing the next challenge of IC technology (part I: integration and packaging trends)
Author :
Schutt-Aine, J.E. ; Sung-Mo Kang
Author_Institution :
University Of Illinois
fDate :
4/1/2001 12:00:00 AM
Keywords :
Bandwidth; Design engineering; Electronics packaging; Fabrication; Integrated circuit interconnections; Integrated circuit noise; Integrated circuit packaging; LAN interconnection; Submillimeter wave technology; Working environment noise;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/JPROC.2001.920574