• DocumentCode
    1483123
  • Title

    RF/wireless interconnect for inter- and intra-chip communications

  • Author

    Chang, Mau-Chung Frank ; Roychowdhury, Vwani P. ; Zhang, Liyang ; Shin, Hyunchol ; Qian, Yongxi

  • Author_Institution
    Dept. of Earth Eng., California Univ., Los Angeles, CA, USA
  • Volume
    89
  • Issue
    4
  • fYear
    2001
  • fDate
    4/1/2001 12:00:00 AM
  • Firstpage
    456
  • Lastpage
    466
  • Abstract
    Recent studies showed that conventional approaches being used to solve problems imposed by hard-wired metal interconnects will eventually encounter fundamental limits and may impede the advance of future ultralarge-scale integrated circuits (ULSls). To surpass these fundamental limits, we introduce a novel RF/wireless interconnect concept for future inter- and intra-ULSI communications. Unlike the traditional “passive” metal interconnect, the “active” RF/wireless interconnect is based on low loss and dispersion-free microwave signal transmission, near-field capacitive coupling, and modem multiple-access algorithms. In this paper we address issues relevant to the signal channeling of the RF/wireless interconnect and discuss its advantages in speed, signal integrity, and channel reconfiguration. The electronic overhead required in the RF/wireless-interconnect system and its compatibility with the future ULSI and MCM (multi-chip-module) will be discussed as well
  • Keywords
    ULSI; integrated circuit interconnections; multichip modules; MCM; RF interconnect; ULSl; active interconnect; electronic overhead; inter-chip communication; intra-chip communication; microwave signal transmission; modem multiple-access algorithm; near-field capacitive coupling; signal channeling; wireless interconnect; Attenuation; Circuits and systems; Conducting materials; Dielectric materials; Integrated circuit interconnections; Power system interconnection; RF signals; Radio frequency; Ultra large scale integration; Wires;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/5.920578
  • Filename
    920578