• DocumentCode
    1483250
  • Title

    Small track width MR sensors stabilized with NiMn

  • Author

    Devasahayam, Adrian J. ; Mountfield, Keith R. ; Kryder, Mark H.

  • Author_Institution
    Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA
  • Volume
    33
  • Issue
    5
  • fYear
    1997
  • fDate
    9/1/1997 12:00:00 AM
  • Firstpage
    2881
  • Lastpage
    2883
  • Abstract
    Small track width magnetoresistive sensors, stabilized with NiMn exchange tabs were fabricated. Two configurations were investigated: one with the NiMn on top and the other with the NiMn at the bottom. Both types of structures were found to be effectively stabilized by the antiferromagnetic NiMn. In order to obtain the desired properties of the NiMn/NiFe exchange couple, a long, high temperature anneal needs to be done. With the second configuration (NiMn at the bottom), the anneal is done before the deposition of the NiFe sensor. This configuration could be extended to spin-valves which are temperature sensitive, and since the anneal is done before the deposition of the NiFe, the sensor material is not subject to the high temperature anneal. The two configurations require different fabrication steps which are described in this paper. The stabilizing properties of NiMn are also compared with NiO
  • Keywords
    Barkhausen effect; annealing; antiferromagnetic materials; iron alloys; magnetic heads; magnetic multilayers; magnetic recording noise; magnetic sensors; magnetoresistive devices; manganese alloys; nickel alloys; MR sensors; NiMn-NiFe; antiferromagnetic layer; exchange couple; exchange tabs; fabrication steps; high temperature anneal; magnetic heads; magnetoresistive sensors; spin-valves; temperature sensitivity; track width; Annealing; Antiferromagnetic materials; Corrosion; Data storage systems; Fabrication; Magnetic materials; Magnetic sensors; Magnetoresistance; Sensor systems; Temperature sensors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.617785
  • Filename
    617785