Title :
Guest Editorial Special Issue on the 2010 IEEE International Instrumentation and Measurement Conference
Author :
Yeary, Mark ; Van Moer, Wendy
fDate :
5/1/2011 12:00:00 AM
Abstract :
The 46 papers in this special issue were originally presented at the 2010 IEEE International Instrumentation and Measurement Conference, held in Austin, TX, on May 3-6, 2010.
Keywords :
Instrumentation and measurement; Meetings; Special issues and sections;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2011.2114530
