Title :
Functional description of connector-switch-attenuator networks
Author :
Cerny, E. ; Gecesi, J.
Author_Institution :
Dept. of Inf. & Res. Oper., Montreal Univ., Que., Canada
fDate :
1/1/1988 12:00:00 AM
Abstract :
The switch-level abstraction of digital MOS circuits has been used primarily in simulators. In formal verification, a functional description must be first extracted from the switch network. It is shown here how the theory of characteristic functions can be applied to analyze such networks and to extract their functional description
Keywords :
electron device testing; failure analysis; field effect integrated circuits; logic testing; switching networks; characteristic functions; connector-switch-attenuator networks; digital MOS circuits; formal verification; functional description; switch-level abstraction; Attenuation; Attenuators; Circuit simulation; Connectors; Formal verification; Logic circuits; MOSFETs; Switches; Switching circuits; Very large scale integration;
Journal_Title :
Computers, IEEE Transactions on
