DocumentCode
1483321
Title
Standardized ESD test for magnetoresistive recording heads
Author
Wallash, Albert J.
Author_Institution
Quantum Corp., Milpitas, CA, USA
Volume
33
Issue
5
fYear
1997
fDate
9/1/1997 12:00:00 AM
Firstpage
2911
Lastpage
2913
Abstract
A methodology and apparatus are described for completely characterizing the electrostatic discharge (ESD) sensitivity of magnetoresistive (MR) recording heads. ESD testing of MR heads from six vendors was performed and a “Human Body Model” (HBM) failure voltage as low as 85 V was measured. Air gap breakdown voltages ranging from 400 V to 1100 V were also found. Two new findings were MR sensor damage when ESD pulses were injected into non-MR pins and corona damage. SEM failure analysis after ESD testing showed melting, pitting, and corona damage of the recording head structure. It is concluded that the MR/ESD tester is useful in studying the electrostatic properties of MR recording heads
Keywords
corona; electrostatic discharge; failure analysis; magnetic heads; magnetoresistive devices; scanning electron microscopy; 400 to 1100 V; 85 V; SEM failure analysis; air gap breakdown voltages; corona damage; electrostatic discharge; failure voltage; human body model; magnetoresistive recording heads; melting; pitting; sensor damage; standardized ESD test; Corona; Disk recording; Electrostatic discharge; Electrostatic measurements; Low voltage; Magnetic heads; Magnetic sensors; Magnetoresistance; Performance evaluation; Testing;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.617795
Filename
617795
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