• DocumentCode
    1483321
  • Title

    Standardized ESD test for magnetoresistive recording heads

  • Author

    Wallash, Albert J.

  • Author_Institution
    Quantum Corp., Milpitas, CA, USA
  • Volume
    33
  • Issue
    5
  • fYear
    1997
  • fDate
    9/1/1997 12:00:00 AM
  • Firstpage
    2911
  • Lastpage
    2913
  • Abstract
    A methodology and apparatus are described for completely characterizing the electrostatic discharge (ESD) sensitivity of magnetoresistive (MR) recording heads. ESD testing of MR heads from six vendors was performed and a “Human Body Model” (HBM) failure voltage as low as 85 V was measured. Air gap breakdown voltages ranging from 400 V to 1100 V were also found. Two new findings were MR sensor damage when ESD pulses were injected into non-MR pins and corona damage. SEM failure analysis after ESD testing showed melting, pitting, and corona damage of the recording head structure. It is concluded that the MR/ESD tester is useful in studying the electrostatic properties of MR recording heads
  • Keywords
    corona; electrostatic discharge; failure analysis; magnetic heads; magnetoresistive devices; scanning electron microscopy; 400 to 1100 V; 85 V; SEM failure analysis; air gap breakdown voltages; corona damage; electrostatic discharge; failure voltage; human body model; magnetoresistive recording heads; melting; pitting; sensor damage; standardized ESD test; Corona; Disk recording; Electrostatic discharge; Electrostatic measurements; Low voltage; Magnetic heads; Magnetic sensors; Magnetoresistance; Performance evaluation; Testing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.617795
  • Filename
    617795