Title :
A 200 mW, 1 Msample/s, 16-b pipelined A/D converter with on-chip 32-b microcontroller
Author :
Mayes, Michael K. ; Chin, Sing W.
Author_Institution :
Nat. Semicond. Corp., Santa Clara, CA, USA
fDate :
12/1/1996 12:00:00 AM
Abstract :
This paper describes the design and implementation of a fully monolithic 16-b, 1 Msample/s, low-power A/D converter (ADC). An on-chip 32-b custom microcontroller calibrates and corrects the pipeline linearity to within 0.75 LSB integral nonlinearity (INL) and 0.6 LSB differential nonlinearity (DNL). High speed and low power are achieved using a pipelined architecture. Errors resulting from capacitor mismatches, finite op-amp open loop gain, charge injection and comparator offset are removed through self-calibration. Coefficients determined during calibration are stored on chip, digitally correcting the pipeline ADC in real time during normal conversion, Full-scale errors are removed through self-calibration and an-chip multiplication. Linearity errors due to capacitor voltage coefficients are reduced using a curve fit algorithm and on-chip ROM. Digital cross-talk errors resulting from the microcontroller running at a rate of ten times the analog sampling rate have prevented implementations of fully monolithic converters of this performance class in the past. Mismatches in cross-talk due to different digital timing between calibration and correction lead to linearity errors at critical correction points. Experimental analysis and circuit techniques which overcome these problems are presented
Keywords :
BiCMOS integrated circuits; analogue-digital conversion; calibration; crosstalk; error correction; microcontrollers; pipeline processing; timing; 16 bit; 200 mW; 32 bit; BiCMOS process; capacitor voltage coefficients; curve fit algorithm; custom microcontroller; digital crosstalk errors; digital timing; error removal; fully monolithic converters; high speed operation; linearity errors; low power design; monolithic ADC; onchip ROM; onchip microcontroller; pipeline linearity calibration; pipeline linearity correction; pipelined A/D converter; pipelined architecture; self-calibration; Calibration; Capacitors; Error correction; Linearity; Microcontrollers; Operational amplifiers; Pipelines; Read only memory; Sampling methods; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of