Title :
Signed and Accurate Measurement of Phase Offset in Optical DPSK Demodulator
Author :
Zhao, Jian ; Lau, Alan Pak Tao ; Lu, Chao ; Tam, H.Y. ; Wai, P.K.A.
Author_Institution :
Sch. of Comput. & Commun. Eng., Tianjin Univ. of Technol., Tianjin, China
fDate :
7/15/2010 12:00:00 AM
Abstract :
Abstract-A signed and accurate phase offset estimation method of the delay interferometer (DI) for the direct detection differential phase-shift keying system based on a delay-tap sampling technique has been demonstrated. A chromatic dispersion offset module was introduced to help the phase offset measurement. The proposed method can not only measure the value but also distinguish the polarity of phase offset of DI. The measurement sensitivity can reach ±4° and measurement range can reach ±75°. The simulation and experimental measurement results are in close agreement with each other.
Keywords :
differential phase shift keying; light interferometry; optical dispersion; delay interferometer; delay-tap sampling technique; direct detection; measurement sensitivity; optical DPSK demodulator; phase offset estimation method; Chromatic dispersion (CD); delay interferometer (DI); delay-tap sampling; differential phase-shift keying (DPSK); optical fiber communication; performance monitoring; phase offset;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2010.2049012