DocumentCode :
1483774
Title :
Signed and Accurate Measurement of Phase Offset in Optical DPSK Demodulator
Author :
Zhao, Jian ; Lau, Alan Pak Tao ; Lu, Chao ; Tam, H.Y. ; Wai, P.K.A.
Author_Institution :
Sch. of Comput. & Commun. Eng., Tianjin Univ. of Technol., Tianjin, China
Volume :
22
Issue :
14
fYear :
2010
fDate :
7/15/2010 12:00:00 AM
Firstpage :
1018
Lastpage :
1020
Abstract :
Abstract-A signed and accurate phase offset estimation method of the delay interferometer (DI) for the direct detection differential phase-shift keying system based on a delay-tap sampling technique has been demonstrated. A chromatic dispersion offset module was introduced to help the phase offset measurement. The proposed method can not only measure the value but also distinguish the polarity of phase offset of DI. The measurement sensitivity can reach ±4° and measurement range can reach ±75°. The simulation and experimental measurement results are in close agreement with each other.
Keywords :
differential phase shift keying; light interferometry; optical dispersion; delay interferometer; delay-tap sampling technique; direct detection; measurement sensitivity; optical DPSK demodulator; phase offset estimation method; Chromatic dispersion (CD); delay interferometer (DI); delay-tap sampling; differential phase-shift keying (DPSK); optical fiber communication; performance monitoring; phase offset;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2010.2049012
Filename :
5458064
Link To Document :
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