DocumentCode :
1483837
Title :
Surface-discharge switch design: the critical factor
Author :
Engel, Thomas G. ; Kristiansen, M. ; Baker, Mary C. ; Hatfield, L.L.
Author_Institution :
Texas Tech. Univ., Lubbock, TX, USA
Volume :
38
Issue :
4
fYear :
1991
fDate :
4/1/1991 12:00:00 AM
Firstpage :
740
Lastpage :
744
Abstract :
Dielectric properties that are critical to designing a long-life surface-discharge switch (SDS) are investigated. Theory is correlated with experiment by evaluating the performance of a large group of polymeric and ceramic dielectrics. These dielectrics are tested in a single-channel, self-commutating SDS operating at ~35 kV and ~300 kA (oscillatory discharge) with a pulse length of ~20 μs (1/4 period ~2 μs). The performance of a dielectric is characterized by its shot-to-shot breakdown voltage and by its mass erosion. Theoretically, the voltage holdoff degradation resistance (HDR) and the arc melting/erosion resistance (AMR) of a dielectric can be qualitatively predicted from its formativity and its impulsivity, respectively. The formativity and impulsivity are figures of merit calculated from the known thermophysical properties of the dielectric. The effects produced in dielectric performance by choice of electrode material (e.g., molybdenum, graphite, and copper-tungsten) and discharge repetition rate are also discussed
Keywords :
arcs (electric); gas-discharge tubes; switches; arc melting/erosion resistance; ceramic dielectrics; dielectric performance; discharge repetition rate; formativity; impulsivity; mass erosion; polymeric dielectrics; pulse length; self-commutating SDS; shot-to-shot breakdown voltage; surface-discharge switch; thermophysical properties; voltage holdoff degradation resistance; Ceramics; Conducting materials; Degradation; Dielectric materials; Electrodes; Polymers; Pulse modulation; Switches; Thermal conductivity; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.75199
Filename :
75199
Link To Document :
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