DocumentCode :
1483840
Title :
The ultra clean sputtering process and high density magnetic recording media
Author :
Takahashi, Migaku ; Kikuchi, Akira ; Kawakita, Shinya
Author_Institution :
Dept. of Electron. Eng., Tohoku Univ., Sendai, Japan
Volume :
33
Issue :
5
fYear :
1997
fDate :
9/1/1997 12:00:00 AM
Firstpage :
2938
Lastpage :
2943
Abstract :
The ultra clean sputtering process (UC-process) was newly introduced in the fabrication of CoNiCr and CoCrTa thin film media to establish the new concept of controlling the microstructure and magnetic properties. The relation between cleanness during film deposition process and magnetic properties has been discussed in connection with their microstructure. The UC-process presented enables the control of the fine structure of the thin film media and resulted in excellent magnetic properties. This study demonstrates that the UC-process is very superior to the normal process presently used and plays a dominant role for the thin film media fabrication
Keywords :
chromium alloys; cobalt alloys; coercive force; magnetic recording; magnetic recording noise; magnetic thin films; nickel alloys; sputter deposition; tantalum alloys; CoCrTa; CoNiCr; film deposition process; fine structure; high density magnetic recording media; magnetic properties; microstructure; thin film media fabrication; ultra clean sputtering process; Argon; Coercive force; Fabrication; Impurities; Magnetic films; Magnetic properties; Magnetic recording; Microstructure; Sputtering; Substrates; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.617804
Filename :
617804
Link To Document :
بازگشت