• DocumentCode
    1483909
  • Title

    Temperature-Dependent Threshold Current in InP Quantum-Dot Lasers

  • Author

    Smowton, Peter M. ; Elliott, Stella N. ; Shutts, Samuel ; Al-Ghamdi, Mohammed S. ; Krysa, Andrey B.

  • Author_Institution
    Sch. of Phys. & Astron., Cardiff Univ., Cardiff, UK
  • Volume
    17
  • Issue
    5
  • fYear
    2011
  • Firstpage
    1343
  • Lastpage
    1348
  • Abstract
    We explore the origins of the threshold current temperature dependence in InP quantum-dot (QD) lasers. While the internal optical mode loss does not change with temperature, the peak gain required to overcome the losses becomes more difficult to achieve at elevated temperature due to the thermal spreading of carriers among the available states. In 2-mm-long lasers with uncoated facets, this effect is responsible for 66% of the difference in threshold current density between 300 and 360 K. Spontaneous recombination current only makes up at most 10% of the total recombination current density over this temperature range, but the temperature dependence of the spontaneous recombination in the QD and quantum-well capping layers can be used, assuming only a simple proportional nonradiative recombination process, to explain the temperature dependence of the threshold current density.
  • Keywords
    III-V semiconductors; current density; indium compounds; laser modes; optical losses; quantum dot lasers; InP; carriers thermal spreading; internal optical mode loss; quantum-dot lasers; quantum-well capping layers; recombination current density; size 2 mm; spontaneous recombination current; temperature 300 K to 360 K; temperature-dependent threshold current; Current density; Radiative recombination; Temperature dependence; Temperature measurement; Threshold current; Nonradiative recombination; quantum-dot (QD) devices; semiconductor laser; short-wavelength lasers; threshold current density;
  • fLanguage
    English
  • Journal_Title
    Selected Topics in Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    1077-260X
  • Type

    jour

  • DOI
    10.1109/JSTQE.2011.2115235
  • Filename
    5740568