Title :
Bias correction for the maximum likelihood estimates in the two-parameter Weibull distribution
Author_Institution :
Dept. of Comput. Sci. & Syst. Eng., Kyushu Univ., Fukuoka, Japan
fDate :
2/1/1999 12:00:00 AM
Abstract :
This paper provides a simple bias correction method for the maximum likelihood estimates in the 2-parameter Weibull distribution. The unbiased estimates of the shape and scale parameters as well as the percentile points can be obtained by using a simple formula
Keywords :
Weibull distribution; maximum likelihood estimation; bias correction; maximum likelihood estimation; percentile point; scale parameter; shape parameter; two-parameter Weibull distribution; Computer science; Costs; Least squares approximation; Maximum likelihood estimation; Mechanical engineering; Parameter estimation; Shape; Systems engineering and theory; Testing; Weibull distribution;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
