• DocumentCode
    1484053
  • Title

    Pulse sharpening in a uniform LC ladder network containing nonlinear ferroelectric capacitors

  • Author

    Wilson, Colin Richard ; Turner, Miles M. ; Smith, Paul W.

  • Author_Institution
    Dept. of Phys. & Astron., St. Andrews Univ., UK
  • Volume
    38
  • Issue
    4
  • fYear
    1991
  • fDate
    4/1/1991 12:00:00 AM
  • Firstpage
    767
  • Lastpage
    771
  • Abstract
    A new method of pulse sharpening is described in which the risetime of a high-voltage pulse is progressively reduced as it propagates along a uniform lumped-element delay line containing nonlinear ferroelectric capacitors. The capacitors are made from a barium-titanate-based ceramic dielectric whose relative permittivity reduces with applied voltage stress. The resultant drop in capacitance causes the phase velocity of an electrical pulse propagating on the delay line to increase with increasing pulse amplitude. Therefore, the time delay of each section of the line is also amplitude dependent, causing the crest of the pulse to catch up with the low-amplitude portion of its leading edge. In the experiment described, the risetime of the leading edge of a 28-kV voltage pulse was reduced from 280 to 50 ns as it propagated along a 15-section ladder network. It is found that the impedance of the ladder is amplitude dependent, and the problem of matching the line with a nonreactive linear load resistance is discussed. Techniques are described for characterizing the nonlinearity of the capacitors and also for measuring their loss
  • Keywords
    delay lines; ladder networks; nonlinear network analysis; pulse shaping circuits; 28 kV; BaTiO3; applied voltage stress; high-voltage pulse; ladder network; nonlinear ferroelectric capacitors; nonreactive linear load resistance; phase velocity; pulse sharpening; relative permittivity; uniform; uniform lumped-element delay line; Capacitance; Capacitors; Ceramics; Delay effects; Delay lines; Dielectrics; Ferroelectric materials; Permittivity; Stress; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.75203
  • Filename
    75203