Title :
Analysis of transition noise in thin film media
Author :
Xing, Xinzhi ; Bertram, H. Neal
Author_Institution :
Center for Magnetic Recording Res., California Univ., San Diego, La Jolla, CA, USA
fDate :
9/1/1997 12:00:00 AM
Abstract :
In this work, experimental techniques involving spectral and temporal analysis were used to determine the weights of each noise “mode”. A criterion for accurate spectral analysis to determine the cross track correlation length and transition parameter is presented
Keywords :
magnetic recording noise; magnetic thin film devices; magnetisation; spectral analysis; cross track correlation length; magnetisation fluctuations; spectral analysis; temporal analysis; thin film media; transition noise; Error analysis; Fluctuations; Jitter; Magnetic analysis; Magnetic heads; Magnetization; Noise shaping; Signal to noise ratio; Spectral analysis; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
