DocumentCode :
1484341
Title :
Electrical Modeling and Design of a Wafer-Level Package for MEM Resonators
Author :
Perruisseau-Carrier, Julien ; Mazza, M. ; Jourdain, A. ; Skrivervik, A.K. ; Ionescu, A.M. ; Tilmans, H.A.C.
Author_Institution :
Centre Tecnol. de Telecomunicacions de Catalunya (CTTC), Barcelona, Spain
Volume :
33
Issue :
2
fYear :
2010
fDate :
5/1/2010 12:00:00 AM
Firstpage :
534
Lastpage :
542
Abstract :
This paper presents the electrical design and characterization of a wafer-level, or 0-level, package for micro-electromechanical resonators. We start by identifying the requirements on the electrical parasitics of a packaged resonator, derived from an analysis of the oscillator circuit comprising the resonator. Then, using the deduced requirements as a starting point, an optimized design of the package is developed in a two-step procedure. First, initial choices for the package topology are made on the basis of intuitive and physical circuit models. Second, a more detailed analysis is carried out by means of full-wave simulations and circuit models extractions. Measured results on empty packages are presented, validating both circuit models and full-wave simulation results. Finally, the parasitics values obtained are discussed in the light of the implementation of an oscillator circuit, demonstrating the possibility to implement functioning oscillators based on the proposed package.
Keywords :
circuit oscillations; micromechanical resonators; wafer level packaging; MEM resonators; electrical design; electrical modeling; micro-electro-mechanical resonators; oscillator circuit; wafer-level package; Ceramics; Circuit simulation; Electronics packaging; Encapsulation; Micromechanical devices; Oscillators; Q factor; Semiconductor device modeling; Silicon; Wafer scale integration; 0-Level package; electrical parasitics; micro-electromechanical (MEM) resonator; micro-electromechanical system (MEMS); packaging; wafer-level package;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/TADVP.2010.2043101
Filename :
5458310
Link To Document :
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