Title :
A technique for standing wave measurements of pulse-biased semiconductor devices
Author :
Martin, B. ; Hobson, G.S.
fDate :
12/1/1971 12:00:00 AM
Abstract :
A coherent sampling technique is described by which the v.s.w.r. of a pulse-biased semiconductor device mounted in a transmissio line may be measured with a sensitivity comparable to that obtainable in c.w. measurements.
Keywords :
high-frequency transmission line measurements; microwave measurement; semiconductor devices; standing wave meters; coherent sampling; high sensitivity; microwave measurements; pulse biased semiconductor device; standing wave measurements;
Journal_Title :
Radio and Electronic Engineer
DOI :
10.1049/ree.1971.0175
