Title :
Carbon composition, cracked carbon, metal film and metal oxide resistors
Author :
Bardsley, M. ; Dyson, A.F.
fDate :
4/1/1974 12:00:00 AM
Abstract :
Typical manufacturing processes, nominal parameters and the major advantages and disadvantages of carbon composition, metal oxide, carbon film and low value nickel film resistors are discussed. The structure of these resistors is shown by photomicrographs, in some cases coupled with X-ray probe analysis.
Keywords :
X-ray chemical analysis; manufacturing processes; microscopy; photographic applications; resistors; X-ray probe analysis; carbon composition; cracked carbon; manufacturing processes; metal film resistors; metal oxide resistors; nickel film resistors; photomicrographs;
Journal_Title :
Radio and Electronic Engineer
DOI :
10.1049/ree.1974.0052
