• DocumentCode
    1484569
  • Title

    DVB-T BER measurements in the presence of adjacent channel and co-channel analogue television interference

  • Author

    Vélez, M.M. ; Angueira, P. ; de la Vega, David ; Arrinda, A. ; Ordiales, J.L.

  • Author_Institution
    Coll. of Eng., Univ. of the Basque Country, Bilbao, Spain
  • Volume
    47
  • Issue
    1
  • fYear
    2001
  • fDate
    3/1/2001 12:00:00 AM
  • Firstpage
    80
  • Lastpage
    84
  • Abstract
    This paper presents some laboratory tests carried out to measure the BER degradation caused by an analogue PAL-G television interference on a COFDM 8 K digital television signal. The tests made include co-channel and both upper and lower adjacent channel interference situations. Previously, the ITU-R has presented some protection ratios to be sought when planning DVB-T networks. The results of the work presented here include a wider range of power ratios and their effect on the BER rather than the limit protection values. The new digital services will share the same frequency bands as the conventional analogue television so the exact characterization of mutual interference is a major concern of broadcasters during the transition period when both systems have to co-exist
  • Keywords
    OFDM modulation; adjacent channel interference; cochannel interference; digital video broadcasting; error statistics; television interference; television networks; BER degradation measurement; COFDM digital television signal; DVB-T BER measurements; DVB-T network planning; ITU-R; adjacent channel analogue television interference; analogue PAL-G television interference; co-channel analogue television interference; digital services; frequency bands; laboratory tests; mutual interference; power ratios; protection ratios; Bit error rate; Degradation; Digital TV; Digital video broadcasting; Frequency; Interchannel interference; Laboratories; Power system protection; TV interference; Testing;
  • fLanguage
    English
  • Journal_Title
    Broadcasting, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9316
  • Type

    jour

  • DOI
    10.1109/11.920785
  • Filename
    920785