• DocumentCode
    1484570
  • Title

    Numerical model for electrical charge injection in the acoustic charge-transport device

  • Author

    Bogus, Edward G. ; Hoskins, Michael J. ; Hunsinger, Bill J.

  • Author_Institution
    Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
  • Volume
    38
  • Issue
    4
  • fYear
    1991
  • fDate
    4/1/1991 12:00:00 AM
  • Firstpage
    822
  • Lastpage
    830
  • Abstract
    A two dimensional model is developed to study the electrical charge injection process at the input of a GaAs buried-channel acoustic charge-transport device. The model allows for nonuniform impurity doping profiles, variable epitaxial layer configurations, and arbitrary structural designs of the input electrode architecture. The acoustic wave potential is incorporated as a time- and space-varying doping density that adds directly to the impurity doping density. The wave-induced doping density is obtained from the piezoelectric displacement charge that accompanies the acoustic wave. The partial differential equations which form the mathematical basis of the charge injection process are derived from the semiconductor transport equations and solved numerically. The algorithm for simulating charge injection and the results of a simulation are presented. This model provides a means for characterizing the electrical performance of the acoustic charge-transport device input circuit in terms of device physics
  • Keywords
    III-V semiconductors; charge-coupled devices; doping profiles; gallium arsenide; semiconductor epitaxial layers; surface acoustic wave devices; GaAs; acoustic charge-transport device; acoustic wave potential; electrical charge injection; input electrode architecture; nonuniform impurity doping profiles; partial differential equations; piezoelectric displacement charge; semiconductor transport equations; space-varying doping density; time-varying doping density; two dimensional model; variable epitaxial layer configurations; Acoustic devices; Acoustic waves; Circuit simulation; Doping profiles; Gallium arsenide; Impurities; Numerical models; Partial differential equations; Semiconductor device doping; Semiconductor process modeling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.75212
  • Filename
    75212