• DocumentCode
    1485233
  • Title

    Experimental study of recording performance of sendust and CoZrNb keepered thin film media

  • Author

    Chen, Jinghuan ; Lin, Xiangdong ; Zhu, Jian-Gang ; Judy, Jack H. ; Coughlin, Thomas M.

  • Author_Institution
    Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
  • Volume
    33
  • Issue
    5
  • fYear
    1997
  • fDate
    9/1/1997 12:00:00 AM
  • Firstpage
    3040
  • Lastpage
    3042
  • Abstract
    Sendust and CoZrNb were sputtered on longitudinal CoCr12Ta2 thin film media as alternative keeper materials to NiFe. Experiments were performed to study the dependence of recording performance on the thickness of the keeper and Cr break layer, head bias current, and recording density. It was found that a thinner (50 Å) CoZrNb keepered media can achieve the same amplitude improvement as obtained by a 150 Å thick sendust keeper. Spin-stand time decay measurements show that Sendust keepered media has a significantly lower decay rate (1.1% per decade) than its unkeepered counterpart (2.8% per decade). A magnetic force microscope (MFM) was used to observe the flux from transitions under a 50 Å and 250 Å keeper layers when an external magnetic field of 60 Oe is applied
  • Keywords
    aluminium alloys; chromium alloys; cobalt alloys; demagnetisation; ferromagnetic materials; iron alloys; magnetic force microscopy; magnetic recording; magnetic thin films; niobium alloys; silicon alloys; tantalum alloys; zirconium alloys; decay rate; external magnetic field; head bias current; keeper materials; keepered thin film media; magnetic force microscope; recording density; recording performance; spin-stand time decay measurements; Chromium; Coercive force; Demagnetization; Magnetic field measurement; Magnetic force microscopy; Magnetic forces; Magnetic heads; Radio frequency; Soft magnetic materials; Space vector pulse width modulation; Sputtering; Testing; Time measurement; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.617837
  • Filename
    617837