Title :
Scenario-Based Specification of Automotive Requirements With Quantitative Constraints and Synthesis of SL/SF Monitors
Author :
Arora, Silky ; Gadkari, Ambar A. ; Ramesh, S.
Author_Institution :
India Sci. Lab., Gen. Motors R&D, Bangalore, India
fDate :
6/1/2011 12:00:00 AM
Abstract :
Requirements of embedded systems often describe the system behavior with quantitative constraints over parameters such as timing, memory, and other resources. In this letter, we present a visual language suited for scenario-based specification of requirements with quantitative constraints. Our language, known as event sequence charts with quantitative constraints (ESC-QC), is inspired by message sequence charts (MSC) and its variants. We introduce ESC-QC notations through an example from automotive requirements and then describe the formal syntax and semantics. Besides being useful for formal documentation and analysis of system requirements, ESC-QC specifications can be translated into monitors and used for run-time verification of designs. In automotive systems Simulink/Stateflow (SL/SF) is widely used for design of control systems. We have developed an algorithm for automatic synthesis of SL/SF monitors from ESC-QC specifications. We have used this algorithm for generating monitors for verification of controller models from active safety and body control applications.
Keywords :
automotive engineering; control engineering computing; embedded systems; formal specification; visual languages; SL-SF monitors synthesis; Simulink-Stateflow; automotive requirements; body control applications; control system design; controller models; embedded systems; event sequence charts with quantitative constraints; formal documentation; formal syntax; run time design verification; scenario based specification; system requirements analysis; visual language; Automotive engineering; Delay; Monitoring; Semantics; Synchronization; Vehicles; Visualization; Monitor synthesis; Simulink/Stateflow; scenario-based specification;
Journal_Title :
Embedded Systems Letters, IEEE
DOI :
10.1109/LES.2011.2127445