DocumentCode :
1485261
Title :
High-speed noise-immune AlGaAs/GaAs HBT logic for static memory application
Author :
Hagley, W. Andre ; Day, Derek ; Malhi, Duljit S. ; Xu, J.M.
Author_Institution :
Bell-Northern Res., Ottawa, Ont., Canada
Volume :
38
Issue :
4
fYear :
1991
fDate :
4/1/1991 12:00:00 AM
Firstpage :
932
Lastpage :
934
Abstract :
The authors evaluate the performance of a new gate topology that gives large logic swings and a high noise margin at low power dissipation. The measured noise margin (43% of the 3-V logic swing) and transfer characteristics for a hybrid inverter using an AlGaAs/GaAs heterojunction bipolar transistor (HBT) are presented along with simulated data for an integrated device. These simulations lead to a modified structure demonstrating substantially improved transient response and reduced power dissipation (23 ps and 2.1 mW) while maintaining a large noise margin (45% of the 3-V logic swing). Its performance compares favorably with that of emitter coupled logic (ECL)
Keywords :
III-V semiconductors; aluminium compounds; bipolar integrated circuits; electron device noise; gallium arsenide; heterojunction bipolar transistors; integrated logic circuits; integrated memory circuits; 2.1 mW; HBT logic; gate topology; heterojunction bipolar transistor; high-speed noise-immune logic; hybrid inverter; integrated device; power dissipation; static memory application; transfer characteristics; transient response; Circuit noise; Diodes; Gallium arsenide; Heterojunction bipolar transistors; Inverters; Logic devices; Noise measurement; Noise reduction; Power dissipation; Threshold voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.75227
Filename :
75227
Link To Document :
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