• DocumentCode
    1485261
  • Title

    High-speed noise-immune AlGaAs/GaAs HBT logic for static memory application

  • Author

    Hagley, W. Andre ; Day, Derek ; Malhi, Duljit S. ; Xu, J.M.

  • Author_Institution
    Bell-Northern Res., Ottawa, Ont., Canada
  • Volume
    38
  • Issue
    4
  • fYear
    1991
  • fDate
    4/1/1991 12:00:00 AM
  • Firstpage
    932
  • Lastpage
    934
  • Abstract
    The authors evaluate the performance of a new gate topology that gives large logic swings and a high noise margin at low power dissipation. The measured noise margin (43% of the 3-V logic swing) and transfer characteristics for a hybrid inverter using an AlGaAs/GaAs heterojunction bipolar transistor (HBT) are presented along with simulated data for an integrated device. These simulations lead to a modified structure demonstrating substantially improved transient response and reduced power dissipation (23 ps and 2.1 mW) while maintaining a large noise margin (45% of the 3-V logic swing). Its performance compares favorably with that of emitter coupled logic (ECL)
  • Keywords
    III-V semiconductors; aluminium compounds; bipolar integrated circuits; electron device noise; gallium arsenide; heterojunction bipolar transistors; integrated logic circuits; integrated memory circuits; 2.1 mW; HBT logic; gate topology; heterojunction bipolar transistor; high-speed noise-immune logic; hybrid inverter; integrated device; power dissipation; static memory application; transfer characteristics; transient response; Circuit noise; Diodes; Gallium arsenide; Heterojunction bipolar transistors; Inverters; Logic devices; Noise measurement; Noise reduction; Power dissipation; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.75227
  • Filename
    75227