DocumentCode :
1485414
Title :
Effect of substrate temperature on magnetic properties of strontium ferrite thin films
Author :
Morisako, Akimitsu ; Matsumoto, M. ; Takei, S. ; Yamazaki, Tsutomu
Author_Institution :
Dept. of Inf. Eng., Shinshu Univ., Nagano, Japan
Volume :
33
Issue :
5
fYear :
1997
fDate :
9/1/1997 12:00:00 AM
Firstpage :
3100
Lastpage :
3102
Abstract :
Strontium hexagonal ferrite (SrM) thin films were prepared by a dc magnetron sputtering system, and the crystal structure and magnetic properties were studied. It was found that crystallization temperature of SrM film was around 500°C. Preferential orientation of c-axis was observed at the substrate temperature (Ts) of 550°C. The films prepared at Ts of 550°C exhibited the maximum coercivity of 3.5 kOe in the perpendicular direction
Keywords :
coercive force; ferrites; magnetic recording; magnetic thin films; perpendicular magnetic recording; sputtered coatings; 550 degC; SrFe12O19; c-axis; coercivity; crystal structure; dc magnetron sputtering system; hexagonal ferrite thin films; perpendicular direction; preferential orientation; substrate temperature; Coercive force; Crystallization; Ferrite films; Grain size; Magnetic films; Magnetic properties; Shape; Sputtering; Strontium; Substrates; Temperature; X-ray scattering;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.617857
Filename :
617857
Link To Document :
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