Interference enhanced magnetic Kerr rotation in compositionally modulated TbFe/SiO films

Author

Sato, R. ; Saito, N. ; Morishita, T.

Author_Institution

Sci. & Tech. Res. Lab., Japan Broadcasting Corp., Tokyo, Japan

Volume

24

Issue

6

fYear

1988

fDate

11/1/1988 12:00:00 AM

Firstpage

2458

Lastpage

2460

Abstract

Magnetic Kerr rotation in compositionally modulated TbFe/SiO films is reported. The spectrum of the Kerr rotation angle is tailored with an appropriate choice of the ratio of the thickness of the TbFe layer to that of the SiO layer, without any change of composition. As the thickness of both the TbFe layers and the SiO layers are small compared to the wavelength of light, the dielectric constant averaged over a compositionally modulated TbFe/SiO film is regarded as an effective dielectric constant of the film. The Kerr rotation angle is enhanced to 25°

Keywords

Kerr magneto-optical effect; iron alloys; magnetic thin films; magneto-optical recording; silicon compounds; terbium alloys; Kerr rotation angle; compositionally modulated TbFe-SiO films; dielectric constant; interference enhanced magnetic Kerr rotation; layer thickness ratio; Amorphous magnetic materials; Dielectric materials; Interference; Magnetic anisotropy; Magnetic films; Magnetic materials; Magnetic modulators; Magnetosphere; Optical films; Refractive index;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.92140

Filename

92140