• DocumentCode
    1486212
  • Title

    High resolution measurement of coercivity variations in magneto-optical recording media

  • Author

    Shieh, H.P.D. ; Kryder, M.H.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Carnegie-Mellon Univ., Pittsburgh, PA, USA
  • Volume
    24
  • Issue
    6
  • fYear
    1988
  • fDate
    11/1/1988 12:00:00 AM
  • Firstpage
    2464
  • Lastpage
    2466
  • Abstract
    The coercivity of amorphous rare-earth-transition-metal magnetooptical recording media has been measured as a function of position on the films utilizing a micro-Kerr-hysteresis-loop tracer with an effective measuring aperture of 0.5 μm. The local variations of wall motion coercivity (Hc) in films whose magnetization reversal was dominated by nucleation were as large as 20%. In contrast, Hc in films whose magnetization reversal was dominated by domain-wall motion exhibited a negligibly small variation from place to place. It was found that the fields required to collapse micron-sized domains were typically 20% less than Hc as measured above. The predominant magnetization-reversal mechanism in the films is mainly determined by fabrication processes
  • Keywords
    Kerr magneto-optical effect; coercive force; magnetic thin films; magneto-optical recording; 0.5 micron; amorphous rare-earth-transition-metal; domain-wall motion; fabrication processes; function of position; high spatial resolution; local variations; magnetization reversal; magnetization-reversal mechanism; magneto-optical recording media; magnetooptical recording media; measurement of coercivity variations; measuring aperture; micro-Kerr-hysteresis-loop tracer; micron-sized domains; nucleation; wall motion coercivity; Amorphous magnetic materials; Amorphous materials; Apertures; Coercive force; Magnetic domains; Magnetic field measurement; Magnetization reversal; Magnetooptic effects; Magnetooptic recording; Position measurement;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.92142
  • Filename
    92142