Magnetooptical characterization of multilayers by incident-angle analysis

Author

Deeter, Merritt N. ; Sarid, Dror

Author_Institution

Opt. Sci. Center, Arizona Univ., Tucson, AZ, USA

Volume

24

Issue

6

fYear

1988

fDate

11/1/1988 12:00:00 AM

Firstpage

2470

Lastpage

2472

Abstract

A method for the accurate determination of the complex magnetooptic constant of magnetic films is described. The technique uses a computer-driven system that measures reflectance and Kerr rotation as functions of incident angle and polarization. Least-squares-type algorithms are used to extract the normal optical constants (n and k) and the complex magnetooptic constant (q). Results on two multilayer magnetic films with different magnetization anisotropies (in-plane and perpendicular) are presented

Keywords

Kerr magneto-optical effect; magnetic thin films; magnetic variables measurement; magneto-optical recording; materials testing; optical variables measurement; Kerr rotation; complex magnetooptic constant; computer-driven system; incident angle; incident polarisation; incident-angle analysis; least squares algorithms; magnetic films; magnetization anisotropies; magnetooptical characterization; multilayer magnetic films; multilayers; normal optical constants; reflectance; Dielectrics; Magnetic analysis; Magnetic materials; Magnetic multilayers; Magnetization; Magnetooptic effects; Optical films; Reflectivity; Rotation measurement; Tensile stress;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.92144

Filename

92144