Title :
Magnetooptical characterization of multilayers by incident-angle analysis
Author :
Deeter, Merritt N. ; Sarid, Dror
Author_Institution :
Opt. Sci. Center, Arizona Univ., Tucson, AZ, USA
fDate :
11/1/1988 12:00:00 AM
Abstract :
A method for the accurate determination of the complex magnetooptic constant of magnetic films is described. The technique uses a computer-driven system that measures reflectance and Kerr rotation as functions of incident angle and polarization. Least-squares-type algorithms are used to extract the normal optical constants (n and k) and the complex magnetooptic constant (q). Results on two multilayer magnetic films with different magnetization anisotropies (in-plane and perpendicular) are presented
Keywords :
Kerr magneto-optical effect; magnetic thin films; magnetic variables measurement; magneto-optical recording; materials testing; optical variables measurement; Kerr rotation; complex magnetooptic constant; computer-driven system; incident angle; incident polarisation; incident-angle analysis; least squares algorithms; magnetic films; magnetization anisotropies; magnetooptical characterization; multilayer magnetic films; multilayers; normal optical constants; reflectance; Dielectrics; Magnetic analysis; Magnetic materials; Magnetic multilayers; Magnetization; Magnetooptic effects; Optical films; Reflectivity; Rotation measurement; Tensile stress;
Journal_Title :
Magnetics, IEEE Transactions on
