Title :
Extensions of Compressed Imaging: Flying Sensor, Coded Mask, and Fast Decoding
Author :
Ma, Jianwei ; Hussaini, M. Yousuff
Author_Institution :
Program in Comput. Sci. & Eng., Florida State Univ., Tallahassee, FL, USA
Abstract :
In this paper, we outline some recent advances and identify some open problems in compressed sensing (CS) for remote imaging and related imaging applications. We propose new approaches to compressed remote sensing and image reconstruction, which exploit redundant/overlapping measurements (RMs), multiplexing imaging (MI), and an effective iterative procedure for decoding in the recovery phase. The RM approach involves the concept of data fusion and applies a noiselet transform to a CS measurement matrix, followed by 2-D hexagonal jittered sampling and 1-D jitter-based circular sampling. The MI approach enlarges the field of regard of imaging and provides the compromise between the numbers of masks and detectors by taking advantage of the merits of previous single-pixel sequent imaging and multipixel parallel imaging. Finally, the new decoding method in the CS recovery stage combines Bregman-based nonlocal total variation with curvelet-active-set iteration.
Keywords :
data compression; image coding; image reconstruction; image sensors; iterative methods; jitter; multiplexing; noise; remote sensing; sensor fusion; signal sampling; wavelet transforms; 1D jitter based circular sampling; 2D hexagonal jittered sampling; coded mask; compressed imaging; compressed remote sensing; compressed sensing; curvelet active set iteration; data fusion; effective iterative process; fast decoding; flying sensor; image reconstruction; measurement matrix; multiplexing imaging; noiselet transform; phase recovery; redundant overlapping measurement; remote imaging; Decoding; Imaging; Multiplexing; Noise measurement; Pixel; Remote sensing; Transforms; Compressed sensing (CS); curvelet active sets; flying sensor; nonlocal total variation (TV); remote sensing; split Bregman iteration;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2011.2122530