Title :
Auger spectroscopy analysis of metal/ferrite interface layer in metal-in-gap magnetic head
Author :
Kajiwara, K. ; Hayakawa, M. ; Kunito, Y. ; Ikeda, Y. ; Hayashi, K. ; Aso, K. ; Ishida, T.
Author_Institution :
Sony Corp. Res. Center, Yokohama, Japan
fDate :
11/1/1988 12:00:00 AM
Abstract :
It is well known that a poor magnetic layer is formed at the interface between the metal film (e.g. Sendust) and the ferrite core in fabricating metal-in-gap heads. The authors have analyzed precisely the poor magnetic layer by means of Auger spectroscopy combined with ion sputtering. It is found that the poor magnetic layer is formed by reaction at the interface between the metal film and the substrate during the annealing process. In the case of Sendust, this layer is composed of Al2O3+SiO2, which is a nonmagnetic material. For a new soft magnetic alloy, Fe-Ga-Si-Ru, used instead of sendust, the reacted layer is composed of SiO2/Ga 2O3. To prevent the reaction, a very thin intermediate film of SiO2 or Si-N-O was formed by sputtering
Keywords :
Auger effect; ferrite applications; ferrites; interface phenomena; magnetic heads; sputtering; Al2O3; Al2O3-SiO2; Auger spectroscopy analysis; Fe-Ga-Si-Ru; FeGaSiRu-SiNO; FeGaSiRu-SiO2; FeSiAl; MIG type; SiO2-Ga2O3; SiO2/Ga2O3 reacted layer; annealing process; ion sputtering; magnetic head; metal-in-gap heads; metal/ferrite interface layer; poor magnetic layer; soft magnetic alloy; substrate; Annealing; Ferrite films; Magnetic analysis; Magnetic cores; Magnetic films; Magnetic heads; Soft magnetic materials; Spectroscopy; Sputtering; Substrates;
Journal_Title :
Magnetics, IEEE Transactions on
