Title :
Phase-Dependent Single-Event Sensitivity Analysis of High-Speed A/MS Circuits Extracted from Asynchronous Measurements
Author :
Armstrong, S.E. ; Loveless, T.D. ; Hicks, J.R. ; Holman, W.T. ; McMorrow, D. ; Massengill, L.W.
Author_Institution :
NAVSEA Crane, Crane, IN, USA
fDate :
6/1/2011 12:00:00 AM
Abstract :
A method for experimental determination of the phase dependence of single-event sensitivity in high-speed A/MS circuits is presented. The technique ensures testing coverage of the complete data cycle and results in a correlation of errors to the data or clock cycle of the circuit. Designers can apply the information, along with knowledge of the circuit state at the time of errors, to make informed radiation-hardening-by-design decisions.
Keywords :
asynchronous circuits; integrated circuit measurement; integrated circuit testing; radiation hardening (electronics); asynchronous measurements; clock cycle; high-speed A/MS circuits; phase-dependent single-event sensitivity analysis; radiation-hardening-by-design decisions; testing coverage; Charge pumps; Clocks; Lasers; MOS devices; Phase locked loops; Sensitivity; Switches; High speed integrated circuit measurements; semiconductor device radiation effects; single event effects;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2011.2125989
