DocumentCode
1486854
Title
Phase-Dependent Single-Event Sensitivity Analysis of High-Speed A/MS Circuits Extracted from Asynchronous Measurements
Author
Armstrong, S.E. ; Loveless, T.D. ; Hicks, J.R. ; Holman, W.T. ; McMorrow, D. ; Massengill, L.W.
Author_Institution
NAVSEA Crane, Crane, IN, USA
Volume
58
Issue
3
fYear
2011
fDate
6/1/2011 12:00:00 AM
Firstpage
1066
Lastpage
1071
Abstract
A method for experimental determination of the phase dependence of single-event sensitivity in high-speed A/MS circuits is presented. The technique ensures testing coverage of the complete data cycle and results in a correlation of errors to the data or clock cycle of the circuit. Designers can apply the information, along with knowledge of the circuit state at the time of errors, to make informed radiation-hardening-by-design decisions.
Keywords
asynchronous circuits; integrated circuit measurement; integrated circuit testing; radiation hardening (electronics); asynchronous measurements; clock cycle; high-speed A/MS circuits; phase-dependent single-event sensitivity analysis; radiation-hardening-by-design decisions; testing coverage; Charge pumps; Clocks; Lasers; MOS devices; Phase locked loops; Sensitivity; Switches; High speed integrated circuit measurements; semiconductor device radiation effects; single event effects;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2011.2125989
Filename
5741751
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