Surface oxidation of CoCr evaporated films

Author

Honda, K. ; Sugita, R. ; Echigo, N. ; Sakamoto, Y. ; Murakami, Y.

Author_Institution

Matsushita Electr. Ind. Co. Ltd., Osaka, Japan

Volume

24

Issue

6

fYear

1988

fDate

11/1/1988 12:00:00 AM

Firstpage

2664

Lastpage

2666

Abstract

Surface oxidization of evaporated CoCr thin films was carried out by annealing them in air to improve their durability. The scanning-electron-microscopy profile of the oxidized film surface was the same as that of the as-deposited film. The coefficient of kinetic friction was drastically decreased by oxidization, while the scratching durability increased. Auger electron spectroscopy and electron-spectroscopy chemical analysis showed that a 12-nm-thick oxidized surface layer contributed to the desirable properties of the film surface. The oxidized layer appeared to consist mainly of cobalt oxide, and chromium concentration decreased near the film surface. The treatment greatly improved medium durability in a configuration consisting of CoCr tapes and heads on a rotating cylinder

Keywords

Auger effect; annealing; chromium alloys; cobalt alloys; friction; magnetic recording; magnetic tapes; magnetic thin films; oxidation; scanning electron microscope examination of materials; spectrochemical analysis; storage media; vacuum deposited coatings; wear; Auger electron spectroscopy; Co-Cr alloy film; CoO; annealing; electron-spectroscopy chemical analysis; evaporated CoCr thin films; kinetic friction coefficient; magnetic tapes; oxidized film surface; perpendicular recording media; rotating cylinder heads; scanning-electron-microscopy profile; scratching durability; Annealing; Chemical analysis; Cobalt; Electrons; Friction; Kinetic theory; Oxidation; Spectroscopy; Surface treatment; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.92206

Filename

92206