DocumentCode :
1487026
Title :
Optimal Cell Topology Constraint for Monolayer Dual-Polarized Beamscanning Reflectarrays
Author :
Perruisseau-Carrier, Julien
Author_Institution :
Adaptive Micro Nano Wave Syst. Group, Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland
Volume :
11
fYear :
2012
fDate :
7/4/1905 12:00:00 AM
Firstpage :
434
Lastpage :
437
Abstract :
This letter relates to the development of satellite reflectarrays able to scan a single dual-polarized beam, based on monolayer resonating cells embedding digital microelectromechanical systems (MEMS). We study general topology constraints to be imposed on the elementary cell to ensure dual-polarized operation, minimal cross-polarization, and a reduced number of MEMS for a given phase resolution. It is shown that an element electrically invariant to a 90° rotation is the most favorable one, and the theoretical considerations are verified by a design example under both normal and oblique incidence.
Keywords :
micromechanical devices; reflectarray antennas; topology; MEMS; cross-polarization; digital microelectromechanical system; monolayer dual-polarized beamscanning reflectarrays; oblique incidence; optimal cell topology; phase resolution; satellite reflectarrays; Microelectromechanical systems; Micromechanical devices; Reflector antennas; Topology; Cross polarization; dual polarization; microelectromechanical systems (MEMS); reconfigurable antenna; reflectarray;
fLanguage :
English
Journal_Title :
Antennas and Wireless Propagation Letters, IEEE
Publisher :
ieee
ISSN :
1536-1225
Type :
jour
DOI :
10.1109/LAWP.2012.2193654
Filename :
6179301
Link To Document :
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