• DocumentCode
    1487031
  • Title

    500 GHz–750 GHz Rectangular-Waveguide Vector-Network-Analyzer Calibrations

  • Author

    Williams, Dylan F.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Boulder, CO, USA
  • Volume
    1
  • Issue
    2
  • fYear
    2011
  • Firstpage
    364
  • Lastpage
    377
  • Abstract
    We develop an uncertainty analysis that captures the dominant sources of measurement error in state-of-the-art WM-380 (WR 1.5) rectangular-waveguide vector-network-analyzer measurements over the frequency range 500-750 GHz. We use the analysis to assess thru-reflect-line, thru-short-match, and thru-short-radiating-open calibrations. The comparison shows that thru-short-match and thru-short-radiating-open calibrations outperform thru-reflect-line calibrations, and that this is true even when multiple lines and optimal averaging are used to improve the thru-reflect-line calibrations.
  • Keywords
    calibration; measurement errors; network analysers; rectangular waveguides; frequency 500 GHz to 750 GHz; measurement error; rectangular-waveguide vector-network-analyzer calibrations; thru-reflect-line; thru-short-match; thru-short-radiating-open calibrations; uncertainty analysis; Calibration; Displacement measurement; Error analysis; Measurement errors; Measurement uncertainty; Rectangular waveguides; Uncertainty; Calibration; submillimeter wave; uncertainty analysis; vector network analyzer;
  • fLanguage
    English
  • Journal_Title
    Terahertz Science and Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-342X
  • Type

    jour

  • DOI
    10.1109/TTHZ.2011.2127370
  • Filename
    5741780