• DocumentCode
    1487095
  • Title

    Dependence of magnetics, microstructures and recording properties on underlayer thickness in CoNiCr/Cr media

  • Author

    Yogi, Tadashi ; Gorman, Grace L. ; Hwang, Cherngye ; Kakalec, Michael A. ; Lambert, Steven E.

  • Author_Institution
    IBM Almaden Res. Center, San Jose, CA, USA
  • Volume
    24
  • Issue
    6
  • fYear
    1988
  • fDate
    11/1/1988 12:00:00 AM
  • Firstpage
    2727
  • Lastpage
    2729
  • Abstract
    The effect of Cr underlayer thickness on the magnetic, microstructural, and recording properties of sputtered CoNiCr media is reported. Cr thickness was varied from 100 to 2000 Å while the magnetic layer was maintained in the range of 260-300 Å. Measurements using a vibrating sample magnetometer show a monotonic enhancement of coercivity from 600 to 1500 Oe with increasing Cr thickness. Media noise was measured as a function of transition density using a spectrum analyzer. The media noise power at 2400 flux changes per millimeter decreased by a factor of about 10 with the increase in Cr thickness. This reduction is accompanied by a reduction in the coercivity squareness and the development of granular features in CoNiCr grains growing on the columns of the Cr underlayer. These features are consistent with a reduction of exchange coupling among CoNiCr grains
  • Keywords
    chromium; chromium alloys; cobalt alloys; coercive force; ferromagnetic properties of substances; magnetic recording; magnetic thin films; nickel alloys; sputtered coatings; storage media; 100 to 2000 Å; CoNiCr grains; Cr underlayer thickness; coercivity; exchange coupling; granular features; magnetic storage media; media noise power; microstructures; recording properties; sputtered CoNiCr media; transition density; Chromium; Coercive force; Density measurement; Magnetic noise; Magnetic properties; Magnetic recording; Magnetometers; Microstructure; Thickness measurement; Vibration measurement;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.92226
  • Filename
    92226