DocumentCode :
1487095
Title :
Dependence of magnetics, microstructures and recording properties on underlayer thickness in CoNiCr/Cr media
Author :
Yogi, Tadashi ; Gorman, Grace L. ; Hwang, Cherngye ; Kakalec, Michael A. ; Lambert, Steven E.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
Volume :
24
Issue :
6
fYear :
1988
fDate :
11/1/1988 12:00:00 AM
Firstpage :
2727
Lastpage :
2729
Abstract :
The effect of Cr underlayer thickness on the magnetic, microstructural, and recording properties of sputtered CoNiCr media is reported. Cr thickness was varied from 100 to 2000 Å while the magnetic layer was maintained in the range of 260-300 Å. Measurements using a vibrating sample magnetometer show a monotonic enhancement of coercivity from 600 to 1500 Oe with increasing Cr thickness. Media noise was measured as a function of transition density using a spectrum analyzer. The media noise power at 2400 flux changes per millimeter decreased by a factor of about 10 with the increase in Cr thickness. This reduction is accompanied by a reduction in the coercivity squareness and the development of granular features in CoNiCr grains growing on the columns of the Cr underlayer. These features are consistent with a reduction of exchange coupling among CoNiCr grains
Keywords :
chromium; chromium alloys; cobalt alloys; coercive force; ferromagnetic properties of substances; magnetic recording; magnetic thin films; nickel alloys; sputtered coatings; storage media; 100 to 2000 Å; CoNiCr grains; Cr underlayer thickness; coercivity; exchange coupling; granular features; magnetic storage media; media noise power; microstructures; recording properties; sputtered CoNiCr media; transition density; Chromium; Coercive force; Density measurement; Magnetic noise; Magnetic properties; Magnetic recording; Magnetometers; Microstructure; Thickness measurement; Vibration measurement;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.92226
Filename :
92226
Link To Document :
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