• DocumentCode
    148757
  • Title

    Tin pest in lead-free solders? Fundamental studies on the effect of impurities on phase transformation kinetics

  • Author

    Guang Zeng ; McDonald, Stuart D. ; Sweatman, Keith ; Nogita, Kazuhiro

  • Author_Institution
    Nihon Super. Centre for the Manuf. of Electron. Mater., Univ. of Queensland, Brisbane, QLD, Australia
  • fYear
    2014
  • fDate
    23-25 April 2014
  • Firstpage
    135
  • Lastpage
    139
  • Abstract
    Tin is the main component of contemporary lead-free solders. Under equilibrium conditions, tin exists as either a tetragonal β-Sn) or cubic (α-Sn) allotrope at temperatures above and below approximately 13°C, respectively. The transformation from β to α, often referred to as `tin-pest´ is poorly understood, despite the phenomena being documented over 100 years ago. Possibly because the high lead content in traditional solder alloys offers some protection against `tin-pest´, this transformation has not been a priority in solder-related research. With the transition to lead-free solder alloys and the availability of modern analytical techniques there is both an increased need and opportunity to better understand the transformation. This research was conducted to investigate the phase-transformation kinetics of the β to α transformations in high-purity powdered tin using variable temperature synchrotron XRD analysis and electron microscopy. From the results, time-temperature-transformation (TTT) diagrams were developed, with the intention of being used as a baseline for examining the effects of composition in current generation lead-free solders. The effects of pre-exisiting α-Sn and the impurity elements of Pb, Cu, Si and Ge on the β to α transformation kinetics were measured. α-Sn accelerates transformation kinetics, while all other elements tested delayed the transformation.
  • Keywords
    X-ray diffraction; electron microscopy; impurities; phase diagrams; reaction kinetics; solders; solid-state phase transformations; synchrotrons; tin; Sn:(Pb,Cu,Si,Ge); TTT diagrams; XRD analysis; cubic α-Sn allotrope; current generation; electron microscopy; equilibrium conditions; high-purity powdered tin; impurity effect; impurity elements; lead content; lead-free solder alloys; phase transformation kinetics; tetragonal β-Sn allotrope; time-temperature-transformation diagrams; tin pest; variable temperature synchrotron; Annealing; Kinetic theory; Lead; Powders; Silicon; Tin; lead-free solder; phase transformation; tin pest;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging (ICEP), 2014 International Conference on
  • Conference_Location
    Toyama
  • Print_ISBN
    978-4-904090-10-7
  • Type

    conf

  • DOI
    10.1109/ICEP.2014.6826677
  • Filename
    6826677