DocumentCode
148757
Title
Tin pest in lead-free solders? Fundamental studies on the effect of impurities on phase transformation kinetics
Author
Guang Zeng ; McDonald, Stuart D. ; Sweatman, Keith ; Nogita, Kazuhiro
Author_Institution
Nihon Super. Centre for the Manuf. of Electron. Mater., Univ. of Queensland, Brisbane, QLD, Australia
fYear
2014
fDate
23-25 April 2014
Firstpage
135
Lastpage
139
Abstract
Tin is the main component of contemporary lead-free solders. Under equilibrium conditions, tin exists as either a tetragonal β-Sn) or cubic (α-Sn) allotrope at temperatures above and below approximately 13°C, respectively. The transformation from β to α, often referred to as `tin-pest´ is poorly understood, despite the phenomena being documented over 100 years ago. Possibly because the high lead content in traditional solder alloys offers some protection against `tin-pest´, this transformation has not been a priority in solder-related research. With the transition to lead-free solder alloys and the availability of modern analytical techniques there is both an increased need and opportunity to better understand the transformation. This research was conducted to investigate the phase-transformation kinetics of the β to α transformations in high-purity powdered tin using variable temperature synchrotron XRD analysis and electron microscopy. From the results, time-temperature-transformation (TTT) diagrams were developed, with the intention of being used as a baseline for examining the effects of composition in current generation lead-free solders. The effects of pre-exisiting α-Sn and the impurity elements of Pb, Cu, Si and Ge on the β to α transformation kinetics were measured. α-Sn accelerates transformation kinetics, while all other elements tested delayed the transformation.
Keywords
X-ray diffraction; electron microscopy; impurities; phase diagrams; reaction kinetics; solders; solid-state phase transformations; synchrotrons; tin; Sn:(Pb,Cu,Si,Ge); TTT diagrams; XRD analysis; cubic α-Sn allotrope; current generation; electron microscopy; equilibrium conditions; high-purity powdered tin; impurity effect; impurity elements; lead content; lead-free solder alloys; phase transformation kinetics; tetragonal β-Sn allotrope; time-temperature-transformation diagrams; tin pest; variable temperature synchrotron; Annealing; Kinetic theory; Lead; Powders; Silicon; Tin; lead-free solder; phase transformation; tin pest;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging (ICEP), 2014 International Conference on
Conference_Location
Toyama
Print_ISBN
978-4-904090-10-7
Type
conf
DOI
10.1109/ICEP.2014.6826677
Filename
6826677
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