DocumentCode
148767
Title
Constitutive behavior and Anand model of novel lead-free solder Sn-Zn-Bi-In-P
Author
Jian-Chun Liu ; Hong-Jiao Yu ; Gong Zhang ; Zheng-Hong Wang ; Ju-Sheng Ma
Author_Institution
Dept. of Mech. Eng., Tsinghua Univ., Beijing, China
fYear
2014
fDate
23-25 April 2014
Firstpage
156
Lastpage
161
Abstract
The Anand constitutive model has emerged as a popular method to describe the inelastic deformation behavior of Sn-Pb solders and, more recently, to describe the behavior of lead-free solders in electronic assemblies, mainly due to its effective description of constitutive behavior and high compatibility with finite element modes. Heretofore, although plenty of experimental and theoretical works have been conducted on building constitutive models for lead-free solders, e.g. Sn-Ag, Sn-Ag-Cu, Sn-Cu based solders, insufficient works have been conducted on modeling Sn-Zn based lead-free solder alloys. In this paper, a series of compression tests were conducted for a novel lead-free solder Sn-9Zn-2.5Bi-0.5In-0.05P and Sn-8Zn-3Bi solder at three constant strain rates (10-3/s, 10-2/s, 10-1/s) and different temperatures (20°C, 60°C, 100°C). Anand constitutive model was applied to describe the inelastic behavior as well as saturation stress of both solder alloys. Comparison of the experimental results and Anand model predictions were evaluated with the material parameters extracted from compression tests and non-linear least squares fitting of the constitutive relation. The results reveal that, for both two solder alloys, the Anand model predictions are in good agreement with experimental data of stress-strain responses at various strain rates and temperatures applied in the present work. In addition, the stress-strain responses of both solder alloys are also discussed on the basis of experimental data.
Keywords
bismuth alloys; compressive testing; indium alloys; phosphorus alloys; solders; tin alloys; zinc alloys; Anand model; Sn-Zn-Bi-In-P; compression tests; constitutive behavior; electronic assemblies; finite element modes; inelastic behavior; lead-free solder; nonlinear least squares fitting; saturation stress; solder alloys; stress strain responses; temperature 100 degC; temperature 20 degC; temperature 60 degC; Deformable models; Materials; Mathematical model; Metals; Predictive models; Strain; Stress; Anand model; Sn-Zn based solders; compression tests; saturation stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging (ICEP), 2014 International Conference on
Conference_Location
Toyama
Print_ISBN
978-4-904090-10-7
Type
conf
DOI
10.1109/ICEP.2014.6826681
Filename
6826681
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