• DocumentCode
    1487734
  • Title

    Head field measurements in three dimensions

  • Author

    Brug, J.A. ; Bhattacharyya, M.K. ; Perlov, C.M. ; Gill, H.S.

  • Author_Institution
    Hewlett-Packard Lab., Palo Alto, CA, USA
  • Volume
    24
  • Issue
    6
  • fYear
    1988
  • fDate
    11/1/1988 12:00:00 AM
  • Firstpage
    2844
  • Lastpage
    2846
  • Abstract
    A method is described for obtaining all three components of the field produced by a magnetic recording head. The perpendicular component of the field, Hy, is measured in the plane of the air-bearing surface, and from this the three components, Hx, Hy, and Hz , are calculated in the region below the surface. An example is presented of the field distribution for a thin-film head, and a comparison is made with both analytic and three-dimensional finite-element calculations
  • Keywords
    magnetic field measurement; magnetic heads; magnetic thin film devices; 3D magnetic field measurement; air-bearing surface; field distribution; magnetic recording head; perpendicular field component; thin-film head; three-dimensional finite-element calculations; Finite element methods; Laboratories; Magnetic analysis; Magnetic field measurement; Magnetic heads; Magnetic recording; Probes; Thickness measurement; Transistors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.92264
  • Filename
    92264
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1487734