Title :
Head field measurements in three dimensions
Author :
Brug, J.A. ; Bhattacharyya, M.K. ; Perlov, C.M. ; Gill, H.S.
Author_Institution :
Hewlett-Packard Lab., Palo Alto, CA, USA
fDate :
11/1/1988 12:00:00 AM
Abstract :
A method is described for obtaining all three components of the field produced by a magnetic recording head. The perpendicular component of the field, Hy, is measured in the plane of the air-bearing surface, and from this the three components, Hx, Hy, and Hz , are calculated in the region below the surface. An example is presented of the field distribution for a thin-film head, and a comparison is made with both analytic and three-dimensional finite-element calculations
Keywords :
magnetic field measurement; magnetic heads; magnetic thin film devices; 3D magnetic field measurement; air-bearing surface; field distribution; magnetic recording head; perpendicular field component; thin-film head; three-dimensional finite-element calculations; Finite element methods; Laboratories; Magnetic analysis; Magnetic field measurement; Magnetic heads; Magnetic recording; Probes; Thickness measurement; Transistors; Voltage;
Journal_Title :
Magnetics, IEEE Transactions on
